FE-SEM and TEM analysis:
FE-SEM and TEM analysis are members of the scanning electron microscope
family and are used to examine the surface characteristics and
morphology of different samples. In FE-SEM, electron beams with specific
energy and wavelength sweep the sample surface. By the detector data
that have collected the return sample surface electrons, benefits data
is obtained from the sample surface [40-42]. It should be noted that
image quality and high resolution in the images have a direct
relationship with the structure of the sample and the quality of
synthesis and the absence of contamination and unwanted particles, and
samples with a specific structure provide acceptable images [43-45].
The morphology investigation of silver nanoparticles was carried out
using the FE-SEM and TEM imaging technique (Figures 3 and 4). The images
show a spherical morphology for NPs with an average size of 26.11 nm.
Furthermore, aggregation, which is a property of the metallic
nanoparticles, is well seen for the green synthesized silver
nanoparticles [40,41,44,45]. The reported size of the green
synthesized of silver nanoparticles is beginning of 5 nm to 200 nm
[40-43,46].