FE-SEM and TEM analysis:
FE-SEM and TEM analysis are members of the scanning electron microscope family and are used to examine the surface characteristics and morphology of different samples. In FE-SEM, electron beams with specific energy and wavelength sweep the sample surface. By the detector data that have collected the return sample surface electrons, benefits data is obtained from the sample surface [40-42]. It should be noted that image quality and high resolution in the images have a direct relationship with the structure of the sample and the quality of synthesis and the absence of contamination and unwanted particles, and samples with a specific structure provide acceptable images [43-45].
The morphology investigation of silver nanoparticles was carried out using the FE-SEM and TEM imaging technique (Figures 3 and 4). The images show a spherical morphology for NPs with an average size of 26.11 nm. Furthermore, aggregation, which is a property of the metallic nanoparticles, is well seen for the green synthesized silver nanoparticles [40,41,44,45]. The reported size of the green synthesized of silver nanoparticles is beginning of 5 nm to 200 nm [40-43,46].