XRD and CT-scanner setup
X-ray diffraction (XRD) analyses were performed on ~3 g mass of sample with a Bruker D8 Advance X-ray Diffractometer and the related TOPAS software from the Department of Geological Sciences of UT Austin. Samples were dried oven at ~333 K before being ground to powder.
For CT-scanning we used a Fein Focus High Power source, at 120 kV voltage and 0.14 mA current. The X-ray source was filtered using aluminum foil. The CT scanner is equipped with a Perkin Elmer detector, with 0.5 pF gain, and the 1800 projections were collected at 1 fps and 1x1 binning. The source-to-object distance was 150.566 mm, and the source to detector 963.799 mm. We performed a continuous CT scan by averaging 2 frames and by skipping 0 frames. We applied a beam-hardening correction of 0.25 and a post-reconstruction ring correction using the following parameters: oversample = 2, radial bin width = 21, sectors = 32, minimum arc length = 2, angular bin width = 9, angular screening factor = 4. The final reconstructed volume had a voxel size of 33.3 μm and 1873 slices.