Figure 3: Equivalent circuit for representing a 60-cell module.
Each individual cell in this circuit is represented by the1-Diode model
shown in Fig. 2. The diode symbols in grey on the left represent bypass
diodes.
For our study of the effect of I SC mismatches
between the individual cells of the module, we make use of an
illumination inhomogeneity map published by Ramspeck [6], describing
the cetisPV-Moduletest4 system of halm elektronik GmbH. The 270 cm x 160
cm illumination area of this module tester has an inhomogeneity of +/-
0.4%. Fig. 4 shows a center section of 6 x 10 cell positions of the
illumination intensity map published by Ramspeck.