2.3 Material Characterization
The morphology of the synthesized materials was investigated by a field
emission scanning electron microscope (SEM, Hitachi SU8100, Japan) and a
field emission transmission electron microscope (TEM, FEI Tecnai G2 F20
S-TWIN, USA). Meanwhile, the chemical composition ZMOP-x was tested by
energy dispersive spectrometer (EDS). The crystal structure of the
as-prepared materials was studied by X-ray diffractometer (XRD,
D/max2200PC, Cu Kα radiation = 1.5406 Å, Japan). All data were tested
with 2θ values ranging from 10° to 70° with 2°/min scan rate. X-ray
photoelectron spectroscopy (XPS, ESCALAB 250X, USA) was utilized to
ascertain the elemental type and valence states within the samples. The
Fourier transform infrared spectroscopy (FTIR) was used to analyze the
molecular framework of the materials.