Fractal pull-in instability for a micro-electromechanical device with a
current-carrying conductor
Abstract
Pull-in effect always occurs in a micro-electromechanical system, and
its pull-in analysis is essential for the normal operation. This paper
aims at studying the environment effect on the pull-in instability,
especially the nano/micro particles in air. A fractal model is
established using a fractal derivative, and the pull-in instability can
be converted into a novel state of pull-in stability when the fractal
dimension tends to be very small.