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A mass conservative characteristic finite element method with unconditional optimal convergence for semiconductor device problem
  • Xindong Li,
  • Wenwen Xu
Xindong Li
Qilu University of Technology

Corresponding Author:[email protected]

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Wenwen Xu
Qilu University of Technology
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Abstract

We consider a mass conservative type method for semiconductor device problem by employing mixed finite element method (FEM) for electric potential equation, mass conservative characteristic FEM for both electron and hole density equations. The boundedness of numerical solution without certain time step restriction and optimal L^2 error estimates of full discrete scheme are proved. Numerical experiment is presented to verify the effectiveness and unconditional stability of the proposed method.
11 Aug 2022Submitted to Mathematical Methods in the Applied Sciences
12 Aug 2022Submission Checks Completed
12 Aug 2022Assigned to Editor
19 Aug 2022Reviewer(s) Assigned
06 Dec 2022Review(s) Completed, Editorial Evaluation Pending
06 Jan 2023Editorial Decision: Revise Major
10 Feb 20231st Revision Received
15 Feb 2023Submission Checks Completed
15 Feb 2023Assigned to Editor
15 Feb 2023Review(s) Completed, Editorial Evaluation Pending
15 Feb 2023Reviewer(s) Assigned
01 Mar 2023Editorial Decision: Accept