AUTHOREA
Log in Sign Up Browse Preprints

April 29, 2024
Characterization of Very Shallow States in Cryogenic MOSFETs by Wideband Noise Spectr...
Kenji Ohmori, Michihiro Shintani, Shuhei Amakawa, et al.
January 07, 2021
White Noise Characterization of N-MOSFETs for Physics-Based Cryogenic Device Modeling
Kenji Ohmori and Shuhei Amakawa
February 21, 2021
Direct white noise characterization of short-channel MOSFETs
Kenji Ohmori and Shuhei Amakawa
December 24, 2022
Variable-Temperature Broadband Noise Characterization of MOSFETs for Cryogenic Electr...
Kenji Ohmori and Shuhei Amakawa
September 21, 2021
Variable-Temperature Noise Characterization of N-MOSFETs Using an In-Situ Broadband A...
Kenji Ohmori and Shuhei Amakawa