AUTHOREA
Log in
Sign Up
Browse Preprints
LOG IN
SIGN UP
loading page
this is for holding javascript data
Download PDF
DOWNLOAD
Download ZIP
Download LaTeX
Download JATS XML
Track citations
Fork (make a copy)
90
56
FinFET Nanotransistor Downscaling Causes More Short Channel Effects, Less Gate Control, Exponential increase in Leakage Currents, Drastic Process Changes and Unmanageable Power Densities
Afshin Rashid
Afshin Rashid
Corresponding Author:
[email protected]
Author Profile
×
OK