An IPM monitor to measure a detailed profile of the beam has been developed and constructed. The monitor was developed in the course of modernization of the structure operating on the basis of electric field scanning. The monitor also consists of an extractor, a scanner and two electrostatic analyzers in series. A system to control the monitor and process the data has been developed and produced. As a result of performance testing of the monitor it is established that it allows detailed measurements of the profiles of wide beams with a resolution of 1.5х1.5 mm2. It is found that the monitor minimum sensitivity is n‧103 particle/cm2‧s for the 132Хе26+ ion beam with the energy 1.2 MeV/nucleon and the pressure 5 10-4 Pa of permanent gas in the diagnostic unit. The monitor fits for control of both creation of a uniform distribution of the beam profile and continuous observation of uniformity variations during exposition. The detail profile monitors have been developed for the 45 mm diameter beam for a setup to conduct studies in the field of radiobiology and for the 60mm diameter beam for investigation of radiation effects of radioelectronic equipment.

Simple analytical formulas for prompt estimation of the yield and angular distribution of neutrons for calculating the biological shielding of heavy ion accelerators with energies from 1 to 6 MeV/u are presented. The results of calculation are compared with those obtained with the help of the programs LIZE++ and FLUKA as well as with the experimental data available in literature. On the basis of the comparison it can be said that the proposed method can be applied for prompt estimation of the required biological shielding for heavy ion accelerators with energies from 1 to 6 MeV/u that are being constructed or reconstructed. The deviation of the results of such calculations from more precise ones does not exceed a factor of 2, which is comparable with deviations in calculation of biological shielding due to some variety in the spectra of the produced neutrons and variations in protective properties of the materials used as well as in their thickness.