This study evaluates the effectiveness of diverse focal metrics for generating depth maps from focal stacks in both Electro-Optical (EO) and Radio-Frequency (RF) domains. The paper also discusses the potential applicability of these methods to address a broader range of laboratory requirements. The techniques examined include Sobel Convolution, Laplacian Variance, the Tenengrad Method, the Histogram Method, Fourier Analysis, and Haar Wavelet Transforms. The inherent limitations of specific methods are highlighted through empirical data collected from various example datasets.