In Part I of this paper [1], we have proposed the new concept of generalized voltage damping (GVD) and derived the system-wise GVD (sGVD) index for the global assessment of voltage stability and system strength. In Part II of this paper, we extend this concept to develop a port-wise index for quantifying the voltage-damping characteristics locally. To this end, we decompose the sGVD index into individual ports (or buses), thereby forming the port-wise GVD (pGVD) index, which is computable using local measurements. By inheriting the interpretation of the system-wise index, we further prove that the average of pGVD indices across all buses is approximately identical to the sGVD index. Moreover, it exhibits favorable properties absent in existing indices based on the Maximum Lyapunov Exponents (MLE) of terminal voltages, empowering its application as an assessment metric for the supportive capability of specific devices/ports to short-term voltage stability. Experimental simulations carried on a heterogeneous IEEE 39-bus system confirm the theoretical results. The influence of voltage control strategies, control parameters, and integration locations are also analyzed, providing a new perspective to understanding the support of device dynamics to short-term voltage stability.