AUTHOREA
Log in Sign Up Browse Preprints

June 14, 2024
Optimizing Cluster Defect Identification in Silicon Wafers: Impact of Spot Size and S...
Xin Lai and Hao Hu
February 15, 2023
Prediction of wafer handling-induced point defects in 300 mm silicon wafer manufactur...
HAO HU
September 06, 2022
Investigation of Relation of Edge-grip Induced Defects and Near-Edge Flatness on 300...
HAO HU
June 23, 2022
Dissolution of Nickel-Manganese-Gallium Alloys: the first step for manufacturing hybr...
HAO HU and Kari Ullakko